electron microscopy
Electron microscopy allows the observation of details that are not discernible with a conventional optical microscope. The scanning electron microscope (SEM) uses a beam of electrons to examine structures in detail at the microscopic level. It can go down to nanometre resolution, allowing details that are beyond the capabilities of optical devices to be seen. Electrons from the beam interact with the sample surface to generate a signal to form an image. This technology finds applications from biology, industry, and materials research. Applications of electron microscopy include structure analysis, material quality control, and surface examination.
areas of application
- defectoscopy
- display of material structure
- detection of impurities and admixtures
- layer thickness measurement
material structure and defectoscopy
Electron microscopy allows the examination of defects both on the surface and inside the material. These may be very small cracks (micro-cracks), dirt, or defects between layers. The SEM microscope also allows the identification and visualisation of different types of corrosion defects on the surface of the material.
layer thickness measurement
In selected applications, there is a requirement for a guaranteed thickness of the protective coating, which may consist of multiple layers of different materials (e.g., nickel, copper, epoxy, etc.). For precision bonded parts, it is important to control the defined thickness of the adhesive layer (e.g., for laminated magnets).
properties of our microscope
- maximum sample size - diameter 80 mm, height 50 mm
- resolution 8 nm
- magnification up to 100,000x
Jan Kratochvil ml.
